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Add a sandbox NAND flash driver to facilitate testing. This driver supports any number of devices, each using a single chip-select. The OOB data is stored in-band, with the separation enforced through the API. For now, create two devices to test with. The first is a very small device with basic ECC. The second is an 8G device (chosen to be larger than 32 bits). It uses ONFI, with the values copied from the datasheet. It also doesn't need too strong ECC, which speeds things up. Although the nand subsystem determines the parameters of a chip based on the ID, the driver itself requires devicetree properties for each parameter. We do not derive parameters from the ID because parsing the ID is non-trivial. We do not just use the parameters that the nand subsystem has calculated since that is something we should be testing. An exception is made for the ECC layout, since that is difficult to encode in the device tree and is not a property of the device itself. Despite using file I/O t...
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